An analysis of the quality and reliability supplement to the SIA Roadmap

Abstract This is an analysis and summary of the Quality and Reliability Supplement to the 1997 U. S. Semiconductor Industry Roadmap. The key reliability issue with the semiconductor industry over the past 5 years has been the lack of improvement in the Early Life (EL) failure rates. Reasons for this stagnation are discussed and the constraints to quality and reliability improvement in general are presented from a survey conducted by the Q® team. Major portions of this paper are extracted from the Feb. 1997 Q&R National Technology Roadmap

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