Defect-oriented testing of mixed-signal ICs: some industrial experience
暂无分享,去创建一个
[1] Mani Soma,et al. An experimental approach to analog fault models , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.
[2] Robert C. Aitken. A comparison of defect models for fault location with Iddq measurements , 1993, Proceedings of IEEE International Test Conference - (ITC).
[3] Wojciech Maly,et al. FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS , 1991, 1991, Proceedings. International Test Conference.
[4] Robert C. Aitken,et al. A Comparison of Defect Models for Fault Location with Iddq Measurements , 1992, Proceedings International Test Conference 1992.
[5] Manoj Sachdev. Catastrophic defects oriented testability analysis of a class AB amplifier , 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.
[6] Fred G. Kuper,et al. Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability era , 1996 .
[7] Taco Zwemstra,et al. Exploit analog IFA to improve specification based tests [of SC circuits] , 1996, Proceedings ED&TC European Design and Test Conference.
[8] D. M. H. Walker,et al. VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits , 1986, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[9] Mani Soma. Fault modeling and testing generation for sample-and-hold circuits , 1991, 1991., IEEE International Sympoisum on Circuits and Systems.
[10] Manoj Sachdev. Defect Oriented Analog Testing: Strengths and Weaknesses , 1994, ESSCIRC '94: Twientieth European Solid-State Circuits Conference.
[11] Rosa Rodríguez-Montañés,et al. Bridging defects resistance measurements in a CMOS process , 1992, Proceedings International Test Conference 1992.
[12] Manoj Sachdev. A realistic defect oriented testability methodology for analog circuits , 1995, J. Electron. Test..
[13] Manoj Sachdev,et al. Industrial relevance of analog IFA: a fact or a fiction , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).