Polarization propagation of a monochromatic plane wave through layered thin film dielectric media is described using an electric and magnetic field component spinor while the transformation of fields at a dielectric interface is effected using the characteristic matrix for each layer. The characteristic matrix is rendered in a representation of the Pauli spin matrices and expressions constructed for the change of polarization field components. The matrix representation describes a pseudo-spinor rotation of the field components the magnitude of which is given by the phase thickness of the stack and the direction of rotation given by a vector expressed in terms of an optical admittance dependent on the index of refraction and angle of incidence. This method provides a useful and simple calculation procedure for polarization propagation phenomena in optical problems along with potential applications to surface characterization.
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