论文信息 - Statistical Analysis of Silicon PUF responses for Device Identification

Statistical Analysis of Silicon PUF responses for Device Identification

Silicon PUFs have been developed as a method for identification of integrated circuits based on the unique behavior of delay circuits that is caused by process variations during fabrication. In this work we introduce a statistical model that gives a deeper insight into the nature of the responses of Silicon PUFs. Additionally we propose two important post-processing steps that are necessary to extract secure identifiers from the PUF responses.

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