On the analysis of H in thin layers of Pt electroless contacts using elastic recoil detection technique
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M. Roumie | M. Hage-ali | K. Zahraman | B. Nsouli | F. Lmai | A. Zaiour
[1] M. Roumie,et al. Depth profiling and stoichiometry of constituents in platinum electroless contacts on CdTe(111) under different pH values , 2007 .
[2] M. Roumie,et al. First accelerator based ion beam analysis facility in Lebanon: development and applications , 2004 .
[3] M. Roumie,et al. Characterization of electroless Au, Pt and Pd contacts on CdTe and ZnTe by RBS and SIMS techniques , 2004 .
[4] T. Kang,et al. Hydrogenation behavior of deep levels in nominally undoped p-CdTe epilayers grown by molecular beam epitaxy , 1996 .
[5] P. Siffert,et al. Effect of hydrogen on high resitivity p-type CdTe , 1992 .
[6] M. Hage-ali,et al. Polarization-free semi-insulating chlorine doped cadmium telluride , 1980 .
[7] P. Siffert,et al. Methods to suppress polarization in chlorine compensated cadmium telluride detectors , 1977 .
[8] H. Henisch,et al. Minority carrier injection in relaxation semiconductors , 1975 .
[9] M. Mayer,et al. SIMNRA user's guide , 1997 .
[10] Michael Nastasi,et al. Handbook of modern ion beam materials analysis , 1995 .
[11] Leonard C. Feldman,et al. Fundamentals of Surface and Thin Film Analysis , 1986 .
[12] M. Lampert,et al. Volume-Controlled, Two-Carrier Currents in Solids: The Injected Plasma Case , 1961 .