Recursive Pseudoexhaustive Test Pattern Generation

A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2/sup k/ vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusive-or array, and two serial generators that can be easily adopted in a scan-based built-in self-test environment. >

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