Estimation of component reliability in repairable series systems with masked cause of failure by means of latent variables

In this work, we propose two methods, a Bayesian and a maximum likelihood model, for estimating the failure time distribution of components in a repairable series system with a masked (i.e., unknown) cause of failure. As our proposed estimators also consider latent variables, they yield better performance results compared to commonly used estimators from the literature. The failure time model considered here is the Weibull distribution but the proposed models are generic and straightforward for any probability distribution. Besides point estimation, interval estimations are presented for both approaches. Using several simulations, the performances of the proposed methods are illustrated and their efficiency and applicability are shown based on the so-called cylinder problem.

[1]  Larry H. Crow,et al.  Evaluating the reliability of repairable systems , 1990, Annual Proceedings on Reliability and Maintainability Symposium.

[2]  Bin Liu,et al.  Nonparametric Bayesian Analysis for Masked Data From Hybrid Systems in Accelerated Lifetime Tests , 2017, IEEE Transactions on Reliability.

[3]  John A. Nelder,et al.  A Simplex Method for Function Minimization , 1965, Comput. J..

[4]  L. Kuo,et al.  Bayesian reliability modeling for masked system lifetime data , 2000 .

[5]  J. Bert Keats,et al.  Statistical Methods for Reliability Data , 1999 .

[6]  S. Lazic,et al.  Introducing Monte Carlo Methods with R , 2012 .

[7]  Ammar M. Sarhan,et al.  Estimation of components reliability in a parallel system using masked system life data , 2003, Appl. Math. Comput..

[8]  D. Rubin,et al.  Maximum likelihood from incomplete data via the EM - algorithm plus discussions on the paper , 1977 .

[9]  D. Rubin,et al.  Inference from Iterative Simulation Using Multiple Sequences , 1992 .

[10]  T. Fan,et al.  Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions , 2014 .

[11]  William Q. Meeker,et al.  Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications , 2003, Technometrics.

[12]  Masami Miyakawa,et al.  Analysis of Incomplete Data in Competing Risks Model , 1984, IEEE Transactions on Reliability.

[13]  A. Polpo,et al.  Reliability of components of coherent systems: estimates in presence of masked data , 2017, 1707.03173.

[14]  T. Louis Finding the Observed Information Matrix When Using the EM Algorithm , 1982 .

[15]  Chiranjit Mukhopadhyay,et al.  Maximum likelihood analysis of masked series system lifetime data , 2006 .

[16]  William Q. Meeker,et al.  Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes , 2017, Technometrics.

[17]  Xiaoling Xu,et al.  Parameter Inference in a Hybrid System With Masked Data , 2015, IEEE Transactions on Reliability.

[18]  L. Tierney Markov Chains for Exploring Posterior Distributions , 1994 .