A new-designed non-raster scan and precision control for increasing AFM imaging speed
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[1] A. Bazaei,et al. Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate , 2017, IEEE/ASME Transactions on Mechatronics.
[2] S. O. Reza Moheimani,et al. Internal Model Control for Spiral Trajectory Tracking With MEMS AFM Scanners , 2016, IEEE Transactions on Control Systems Technology.
[3] C. Gerber,et al. Imaging modes of atomic force microscopy for application in molecular and cell biology. , 2017, Nature nanotechnology.
[4] D. Croft,et al. Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application , 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).
[5] S. O. Reza Moheimani,et al. Video-Rate Non-Raster AFM Imaging With Cycloid Trajectory , 2020, IEEE Transactions on Control Systems Technology.
[6] Sean B. Andersson,et al. Local circular scanning for autonomous feature tracking in AFM , 2015, 2015 American Control Conference (ACC).
[7] S. O. Reza Moheimani,et al. Video-Rate Lissajous-Scan Atomic Force Microscopy , 2014, IEEE Transactions on Nanotechnology.
[8] Chun-Chieh Wang,et al. Complementary sliding control of non-linear systems , 2002 .
[9] S O R Moheimani,et al. High-speed cycloid-scan atomic force microscopy , 2010, Nanotechnology.
[10] Travis R. Meyer,et al. Ideal Scan Path for High-Speed Atomic Force Microscopy , 2017, IEEE/ASME Transactions on Mechatronics.
[11] Jen-te Yu,et al. Design and Control of Phase-Detection Mode Atomic Force Microscopy for Reconstruction of Cell Contours in Three Dimensions , 2014, IEEE Transactions on Nanotechnology.
[12] Gerber,et al. Atomic Force Microscope , 2020, Definitions.
[13] Sajal K. Das,et al. Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review , 2019, IEEE Access.
[14] L. Fu,et al. Lissajous Hierarchical Local Scanning to Increase the Speed of Atomic Force Microscopy , 2015, IEEE Transactions on Nanotechnology.
[15] Li-Chen Fu,et al. Precision Sinusoidal Local Scan for Large-Range Atomic Force Microscopy With Auxiliary Optical Microscopy , 2015, IEEE/ASME Transactions on Mechatronics.
[16] Ming Zhang,et al. Neural Network Learning Adaptive Robust Control of an Industrial Linear Motor-Driven Stage With Disturbance Rejection Ability , 2017, IEEE Transactions on Industrial Informatics.