Gate frequency sweep: An effective method to evaluate the dynamic performance of AlGaN/GaN power heterojunction field effect transistors
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Gaudenzio Meneghesso | Enrico Zanoni | Hidetoshi Ishida | Matteo Meneghini | Tetsuzo Ueda | C. De Santi | H. Ishida | M. Meneghini | G. Meneghesso | E. Zanoni | C. D. Santi | T. Ueda
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