论文信息 - Full multiple scattering analysis of XANES at the Cd L3 and O K edges in CdO films combined with a soft-x-ray emission investigation - 字舞流文

Full multiple scattering analysis of XANES at the Cd L3 and O K edges in CdO films combined with a soft-x-ray emission investigation

J. Denlinger | P. Olalde-Velasco | K. Yu | W. Walukiewicz | I. Demchenko | O. Hemmers | K. Lawniczak-Jablonska | M. Chernyshova | A. Derkachova | D. Speaks