A High-Precision On-Chip Path Delay Measurement Architecture

In this paper, we present a novel on-chip path delay measurement architecture for efficiently detecting and debugging of delay faults in the fabricated integrated circuits. Several delay stages are employed in the proposed on-chip path delay measurement (OCDM) circuit, whose delay ranges are increased by a factor of two gradually from the last to the first delay stage. Thus, the proposed OCDM circuit can achieve a large delay measurement range with a small quantity of delay stages. A calibration circuit is incorporated into the proposed on-chip path delay measurement technique to calibrate the delay range of the delay stage under process variations. In addition, delay calibration for import lines is conducted to improve the precision of path delay measurement. Experimental results are presented to validate the proposed path delay measurement architecture.

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