Generation-recombination processes and Auger suppression in small-bandgap detectors

Abstract While some noise mechanisms in low band-gap photodetectors are in principle avoidable through the use of optimized growth and device technology procedures, the dominant process in devices working at near ambient temperatures is an Auger mechanism which is a property of the band structure itself. This paper reviews some of the ways in which noise from this source can be largely eliminated. To capitalize on these innovations it seems likely that heterostructure technology will be required in order to avoid extraneous contact related noise problems.