Research on BIT techniques in complex electromagnetic environments

BIT used for equipment fault testing becomes complex and error-prone in complex EME. What makes detecting a fault from a false alarm difficult is the similarity of the feature fluctuations caused by intermittent faults and interference. So this article focuses on stress effect analysis and evaluation, illustrates the testing error mechanism, and proposes proper resolutions for judging intermittent alarms. The logic judge method is proposed for data correctness. But the intermittent excess of the testing feature value is still a problem. The complete feature set is feasible for the information synthesis. The artificial immune algorithm supplies effective processing of testing data. The simulation example validates its usability. However, different types of equipment have their own health states and fault features. Proper fault diagnosis requires data input from the equipment you are operating and from the environment the equipment is operating in, as well as historical testing data to retrain monitors and rebuild correlations between features and BIT alarms.