Design for Testability of Digital Cores Based on Wrapper and TAM

Because of the development of deep submicron manufacture technology and embeddability of cores. conventional methods cannot apply to cores.To solve this problem,a novel test method which consists of wrapper architecture and test access mechanism is presented by IEEE Std1500.Taking 74373 and 74138 for example,the design process which is based on IEEE Std1500 is described in detail.Through of multi-instruction simulation,the design's validity is proved.