Focusing optics for a synchrotron x-radiation microprobe

Abstract We propose two constant deviation and energy-tunable fluorescent microprobe optical designs, which efficiently use X-rays available from bending magnets and insertion devices of synchrotron radiation sources. The simpler system consists of a cylindrically bent multilayer to focus the vertical opening angle by in-plane scattering, a fixed radius cylindrically curved multilayer which sagittally focuses the horizontal divergence and a pinhole to further reduce the beam to microprobe dimensions. A more versatile system has a pair of flat nondispersively arranged diffracting optics followed by crossed elliptical mirrors. These nondispersive combinations can produce a fixed-exit beam. We compare their relative intensity with other optical systems.