The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee
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Mohammad Shahidehpour | Roy Billinton | Chanan Singh | M. P. Bhavaraju | Ron Allan | Q. Chen | S. Kuruganty | P. F. Albrecht | C. Grigg | A. Schneider | Wenyuan Li | S. Haddad | C. C. Fong | R. Mukerji | D. Reppen | C. C. Fong | P. Wong | D. Patton | N. Rau | S. Kuruganty | R. Billinton | C. Singh | M. Shahidehpour | R. Allan | N. Rau | C. Grigg | A. Schneider | R. Mukerji | M. Bhavaraju | P. Albrecht | P. Wong | S. Haddad | Wenyuan Li | D. Patton | N. Reppen | Q. Chen
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