论文信息 - Physical mechanisms of single-event effects in advanced microelectronics

Physical mechanisms of single-event effects in advanced microelectronics

The single-event error rate in advanced semiconductor technologies can be estimated more accurately than conventional methods by using simulation based on accurate descriptions of a large number of individual particle interactions. The results can be used to select the ion types and energies for accelerator testing and to identify situations in which nuclear reactions will contribute to the error rate.

Lloyd W. Massengill | Ronald D. Schrimpf | Robert A. Reed | Robert A. Weller | Marcus H. Mendenhall

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