100 GHZ integrated CMOS passive imager with >100 MV/W responsivity, 23fW/ √HZ NEP

Presented is a 100 GHz fully differential CMOS passive imager for system-on-chip integration, which features high gain, high sensitivity and high resilience to flicker noise and gain variation. It integrates a low-noise amplifier, a Dicke switch, a detector and a baseband programmable gain amplifier in a single chip, and achieves the best noise equivalent power (NEP) (23fW / √Hz/26fW / √Hz for without/with Dicke switch) in CMOS, the highest responsivity (>100 MV/W) in silicon. It also demonstrates 1.96 K noise-equivalent temperature difference in 30 ms integration time.