Evaluation techniques of frequency-dependent I/Q imbalances in wideband quadrature mixers
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[1] H. Kitayoshi,et al. DSP Synthesized Signal Source for Analog Testing Stimulus and New Test Method , 1985, ITC.
[2] Mikko Valkama,et al. Pilot-Based Compensation of Frequency-Selective I/Q Imbalances in Direct-Conversion OFDM Transmitters , 2008, 2008 IEEE 68th Vehicular Technology Conference.
[3] André Bourdoux,et al. Pilot design for Joint Channel and Frequency-Dependent Transmit/Receive IQ Imbalance Estimation and Compensation in OFDM-Based Transceivers , 2007, 2007 IEEE International Conference on Communications.
[4] A. Abidi. Direct-conversion radio transceivers for digital communications , 1995, Proceedings ISSCC '95 - International Solid-State Circuits Conference.
[5] Ali H. Sayed,et al. On the baseband compensation of IQ imbalances in OFDM systems , 2004, 2004 IEEE International Conference on Acoustics, Speech, and Signal Processing.
[6] Koji Asami,et al. An algorithm to evaluate wide-band quadrature mixers , 2007, 2007 IEEE International Test Conference.
[7] K. Soumyanath,et al. A 1.4V, 2.4/5 GHz, 90nm CMOS system in a package transceiver for next generation WLAN , 2005, Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005..
[8] M. Moonen,et al. Digital Compensation of RF Imperfections for Broadband Wireless Systems , 2007, 2007 14th IEEE Symposium on Communications and Vehicular Technology in the Benelux.
[9] Sule Ozev,et al. Low cost characterization of RF transceivers through IQ data analysis , 2007, 2007 IEEE International Test Conference.
[10] Behzad Razavi,et al. RF Microelectronics , 1997 .
[11] Mikko Valkama,et al. Compensation of frequency-selective I/Q imbalances in wideband receivers: models and algorithms , 2001, 2001 IEEE Third Workshop on Signal Processing Advances in Wireless Communications (SPAWC'01). Workshop Proceedings (Cat. No.01EX471).
[12] Sule Ozev,et al. Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers , 2008, 26th IEEE VLSI Test Symposium (vts 2008).