Reliability analysis of shuffle-exchange network systems

Abstract Shuffle-exchange networks (SENs) have been widely considered as practical interconnection systems due to their size of its switching elements (SEs) and uncomplicated configuration. SEN is a network among a large class of topologically equivalent multistage interconnection networks (MINs) that includes omega, indirect binary n-cube, baseline, and generalized cube. In this paper, SEN with additional stages that provide more redundant paths are analyzed. A common network topology with a 2×2 basic building block in a SEN and its variants in terms of extra-stages is investigated. As an illustration, three types of SENs are compared: SEN, SEN with an additional stage (SEN+), and SEN with two additional stages (SEN+2). Finally, three measures of reliability: terminal, broadcast, and network reliability for the three SEN systems are analyzed.

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