论文信息 - XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals - 字舞流文

XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals

K. N. Pankov | E. Domashevskaya | D. Tetelbaum | V. Terekhov | A. Mikhaĭlov | A. Belov | S. Turishchev | S. Zubkov | D. Nikolichev | I. Zanin