Through-process study of factors controlling the critical current density of Ag-sheathed (Bi,Pb)2Sr2Ca2Cu3Ox tapes
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D. Larbalestier | M. Rupich | G. N. Riley | A. Polyanskii | R. Parrella | Qi Li | X. Cai | Jianyi Jiang | L. Schwartzkopf | Ronald D. Parrella