Diagnosis of reconfigurable two-dimensional arrays using a scan approach

This paper presents a new approach for diagnosing (detection and location) reconfigurable two-dimensional arrays. The proposed approach utilizes the augmented switching interconnection network (commonly found in reconfigurable arrays) as multiple parallel scan chains, such that controllability and observability of test vectors can be achieved for each cell. Arrays with homogeneous and nonhomogeneous cells (multipipeline) are analyzed. An example of the application of the proposed approach to an existing array architecture for image processing, is presented.<<ETX>>