Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer.
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[1] Hsing-Huang Tseng,et al. Chemical analysis of HfO2∕Si (100) film systems exposed to NH3 thermal processing , 2007 .
[2] S. Marchesini,et al. Correction of non-linearity effects in detectors for electron spectroscopy , 2004, physics/0412117.
[3] T. Ishikawa,et al. High resolution-high energy x-ray photoelectron spectroscopy using third-generation synchrotron radiation source, and its application to Si-high k insulator systems , 2003 .
[4] P. A. Brühwiler,et al. A very high resolution electron spectrometer , 1994 .
[5] S. Brennan,et al. Performance of a high‐energy‐resolution, tender x‐ray synchrotron radiation beamline (invited) , 1989 .
[6] B. Wannberg,et al. Computer optimization of retarding lens systems for ESCA spectrometers , 1977 .