Built-in current testing-feasibility study
暂无分享,去创建一个
Wojciech Maly | Phil Nigh | P. Nigh | W. Maly
[1] Charles F. Hawkins,et al. Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs , 1986, ITC.
[2] Mark W. Levi,et al. CMOS Is Most Testable , 1981, International Test Conference.
[3] Duncan M. Walker. Yield simulation for integrated circuits , 1987 .
[4] Wojciech Maly,et al. Testing oriented analysis of CMOS ICs with opens , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.
[5] John M. Acken. Testing for Bridging Faults (Shorts) in CMOS Circuits , 1983, 20th Design Automation Conference Proceedings.
[6] M. Renovell,et al. Topology dependence of floating gate faults in MOS integrated circuits , 1986 .
[7] Jerry Soden,et al. Test Considerations for Gate Oxide Shorts in CMOS ICs , 1986, IEEE Design & Test of Computers.
[8] Yashwant K. Malaiya,et al. A New Fault Model and Testing Technique for CMOS Devices , 1982, International Test Conference.
[9] John Paul Shen,et al. Inductive Fault Analysis of MOS Integrated Circuits , 1985, IEEE Design & Test of Computers.
[10] Wojciech Maly,et al. Realistic Fault Modeling for VLSI Testing , 1987, 24th ACM/IEEE Design Automation Conference.
[11] Charles F. Hawkins,et al. Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs , 1985, ITC.
[12] Wojciech Maly,et al. Current sensing for built-in testing of CMOS circuits , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.
[13] John Paul Shen,et al. Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells , 1984, ITC.