The Trench Power MOSFET—Part II: Application Specific VDMOS, LDMOS, Packaging, and Reliability
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Richard K. Williams | Ralf Siemieniec | Mohamed N. Darwish | Yusuke Kawaguchi | Richard A. Blanchard | Phil Rutter | R. Siemieniec | R. Blanchard | M. Darwish | Richard K. Williams | P. Rutter | Y. Kawaguchi
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