Influence of drain bias on the electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors
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Zhaojun Lin | S. Cai | S. Dun | Zhihong Feng | Bo Liu | Zhang Xiongwen | Yuanjie Lü | C. Luan | Fang Yulong | Lingguo Meng | J. Yin