S-band backscattering analysis of wheat using tower-based scatterometer
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Li Liu | Xiaoli Wang | Guojun Wang | Fengli Zhang | Kun Li | Xiaolin Bian | Yun Shao | Qikai Sun | Y. Shao | Fengli Zhang | Kun Li | Xiaolin Bian | Li Liu | Guojun Wang | Qikai Sun | Xiaoli Wang
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