Examination of the statistics of dielectric breakdown

The use of a compound Weibull distribution in both time and electric field for the description of dielectric breakdown data is examined. It is shown that it is insufficient to measure breakdown experimentally using only a single variable such as a constant electric field, since the evaluation of the minimum number of parameters required to characterise the simplest system requires four independent pieces of information. Applicable statistical relationships are derived and applied to a wide range of experimental data. It is shown that, in general, the information that has been published on dielectric breakdown is limited and does not allow full assessment of the breakdown mechanism. Such information as is available is discussed and some broad conclusions about breakdown mechanisms are proposed.

[1]  G. Siddall Vacuum deposition of dielectric films for capacitors , 1959 .

[2]  E. Harari Dielectric breakdown in electrically stressed thin films of thermal SiO2 , 1978 .

[3]  H. J. de Wit,et al.  The Dielectric Breakdown of Anodic Aluminum Oxide , 1976 .

[4]  G. Stone,et al.  The Statistical Analysis of a High Voltage Endurance Test on an Epoxy , 1979, IEEE Transactions on Electrical Insulation.

[5]  N. Klein A theory of localized electronic breakdown in insulating films , 1972 .

[6]  M. Shatzkes,et al.  Statistics of breakdown , 1981 .

[7]  Masayuki Ieda,et al.  Observation of Dielectric Breakdown Sites in Polyethylene Thin Film , 1980 .

[8]  H. J. D. Wit,et al.  The Dielectric Breakdown of Anodic Aluminum Oxide , 1974 .

[9]  N. Klein,et al.  The mechanism of self-healing electrical breakdown in MOS structures , 1966 .

[10]  E. Occhini,et al.  A Statistical Approach to the Discussion of the Dielectric Strength in Electric Cables , 1971 .

[11]  D. Watson Dielectric Breakdown in Perspex , 1973, IEEE Transactions on Electrical Insulation.

[12]  N. Klein,et al.  A statistical model for step and ramp voltage breakdown tests in thin insulators , 1976 .

[13]  J. Carnes,et al.  Self‐Healing Breakdown Measurements of Pyrolytic Aluminum Oxide Films on Silicon , 1971 .

[14]  L. A. Dissado,et al.  Theoretical basis for the statistics of dielectric breakdown , 1983 .

[15]  R. M. Hill,et al.  Non-exponential decay in dielectrics and dynamics of correlated systems , 1979, Nature.

[16]  L. Dissado Dielectric Relaxation and the Structure of Condensed Matter , 1982 .

[17]  L. Dissado,et al.  The examination of correlated noise , 1981 .

[18]  R. Kaneko,et al.  Statistical considerations on impulse breakdown characteristics of cross-linked polyethylene insulated cables , 1975, IEEE Transactions on Power Apparatus and Systems.

[19]  Peter H. Fischer,et al.  The Short-Time Electric Breakdown Behavior of Polyethylene , 1974, IEEE Transactions on Electrical Insulation.

[20]  N. Klein,et al.  Electrical Breakdown in Solids , 1969 .

[21]  E. Occhini,et al.  High voltage cables with extruded insulationߞStatistical controls and reliability evaluation , 1975, IEEE Transactions on Power Apparatus and Systems.

[22]  M. Shatzkes,et al.  Determination of breakdown rates and defect densities in SiO2 , 1982 .

[23]  Characterization of the Growth of Water Trees , 1982, IEEE Transactions on Electrical Insulation.