Optical properties of transparent and heat‐reflecting indium tin oxide films: The role of ionized impurity scattering

The complex dynamical resistivity of high‐quality transparent and heat‐reflecting indium tin oxide films, prepared by reactive e‐beam deposition, was evaluated from spectrophotometric measurements in the 0.25–50‐μm wavelength range. These data are explained in detail from a theory encompassing scattering of free electrons by ionized impurities.

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