HFinFET: A Scalable, High Performance, Low Leakage Hybrid n-Channel FET
暂无分享,去创建一个
[1] K. D. Cantley,et al. Performance Analysis of III-V Materials in a Double-Gate nano-MOSFET , 2007, 2007 IEEE International Electron Devices Meeting.
[2] G. Klimeck,et al. Full-band and atomistic simulation of realistic 40 nm InAs HEMT , 2008, 2008 IEEE International Electron Devices Meeting.
[3] R. Chau,et al. 85nm gate length enhancement and depletion mode InSb quantum well transistors for ultra high speed and very low power digital logic applications , 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
[4] S. Datta,et al. Silicon nano-transistors and breaking the 10 nm physical gate length barrier , 2003, 61st Device Research Conference. Conference Digest (Cat. No.03TH8663).
[5] NEGF analysis of InGaAs Schottky barrier double gate MOSFETs , 2008, 2008 IEEE International Electron Devices Meeting.
[6] Daehyun Kim,et al. 30 nm E-mode InAs PHEMTs for THz and future logic applications , 2008, 2008 IEEE International Electron Devices Meeting.
[7] Chenming Hu,et al. 5nm-gate nanowire FinFET , 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
[8] Chenming Hu,et al. Sub-20 nm CMOS FinFET technologies , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
[9] R. Chau,et al. Benchmarking nanotechnology for high-performance and low-power logic transistor applications , 2004, IEEE Transactions on Nanotechnology.
[10] M. Passlack,et al. Implant-free high-mobility flatband MOSFET: principles of operation , 2006, IEEE Transactions on Electron Devices.
[11] Gerhard Klimeck,et al. Valence band effective-mass expressions in the sp 3 d 5 s * empirical tight-binding model applied to a Si and Ge parametrization , 2004 .
[12] J.A. del Alamo,et al. Logic Performance of 40 nm InAs HEMTs , 2007, 2007 IEEE International Electron Devices Meeting.
[13] K. Natori. Ballistic metal-oxide-semiconductor field effect transistor , 1994 .
[14] Bin Yu,et al. FinFET scaling to 10 nm gate length , 2002, Digest. International Electron Devices Meeting,.