Nanorobotic Manipulation System for 360$^{\circ }$ Characterization Atomic Force Microscopy

Nanorobotic manipulation technique has been regarded as one of the most dominating approaches to upgrade the functions of microscope benefits from its complex and precise operation system. At the current stage, although atomic force microscopy (AFM) is capable of mapping specimens on a two-dimensional/partial three-dimensional (3-D) plane, a full orientation of 360<inline-formula><tex-math notation="LaTeX">$^{\circ }$</tex-math></inline-formula> characterization still remains a challenge for AFM. Taking advantage of a nanorobotic manipulation system (NMS), 360<inline-formula><tex-math notation="LaTeX">$^{\circ }$</tex-math></inline-formula> mapping and 3-D reconstruction of topography and nanomechanical properties are presented in this paper. Compared with recent advances of AFM mapping techniques, our proposed method is able to realize effective, large area characterization and integral results can be directly perceived through 3-D reconstruction. In this paper, a six degrees-of-freedom NMS assembled inside AFM and task specification are first proposed. Second, home positioning method for effective specimen rotation scanning is introduced. Third, 3-D reconstruction methods for the topography and nanomechanical properties of the specimen are presented. After that, 360<inline-formula><tex-math notation="LaTeX">$^{\circ }$</tex-math></inline-formula> characterization of three different types of specimens, human hair (anisotropic biological material), trapezoidal cantilever, and conical micropipette (isotropic inorganic material) are adopted to demonstrate the feasibility and practicability of our proposed system. Finally, the 3-D reconstruction results of selected specimens are analyzed. This paper fills the blank of current AFM topography and nanomechanical characterization methodologies, which is expected to give a long-term impact in the fundamental nanomaterial research and practical micro/nano characterization.

[1]  Ning Xi,et al.  Bionanomanipulation Using Atomic Force Microscopy , 2010, IEEE Nanotechnology Magazine.

[2]  Qiang Huang,et al.  Automated Assembly of Vascular-Like Microtube With Repetitive Single-Step Contact Manipulation , 2015, IEEE Transactions on Biomedical Engineering.

[3]  Toshio Fukuda,et al.  A Vision-Based Automated Manipulation System for the Pick-Up of Carbon Nanotubes , 2017, IEEE/ASME Transactions on Mechatronics.

[4]  Hui Xie,et al.  High-Precision Automated Micromanipulation and Adhesive Microbonding With Cantilevered Micropipette Probes in the Dynamic Probing Mode , 2018, IEEE/ASME Transactions on Mechatronics.

[5]  F. Arai,et al.  In situ measurement of Young's modulus of carbon nanotubes inside a TEM through a hybrid nanorobotic manipulation system , 2006, IEEE Transactions on Nanotechnology.

[6]  Brandon K. Chen,et al.  A Closed-Loop Controlled Nanomanipulation System for Probing Nanostructures Inside Scanning Electron Microscopes , 2016, IEEE/ASME Transactions on Mechatronics.

[7]  Hui Xie,et al.  Ultrahigh-Precision Rotational Positioning Under a Microscope: Nanorobotic System, Modeling, Control, and Applications , 2018, IEEE Transactions on Robotics.

[8]  Sergej Fatikow,et al.  Microrobot System for Automatic Nanohandling Inside a Scanning Electron Microscope , 2007 .

[9]  Alla Sheffer,et al.  Parameterization of Faceted Surfaces for Meshing using Angle-Based Flattening , 2001, Engineering with Computers.

[10]  Gregory A. Dahlen,et al.  TEM validation of CD AFM image reconstruction , 2007, SPIE Advanced Lithography.

[11]  Dragoljub Surdilovic,et al.  Robust robot compliant motion control using intelligent adaptive impedance approach , 1999, Proceedings 1999 IEEE International Conference on Robotics and Automation (Cat. No.99CH36288C).

[12]  Gerber,et al.  Atomic Force Microscope , 2020, Definitions.

[13]  Jun Liu,et al.  Recent advances in nanorobotic manipulation inside scanning electron microscopes , 2016, Microsystems & Nanoengineering.

[14]  Johann Foucher,et al.  Overcoming silicon limitations: new 3D-AFM carbon tips with constantly high-resolution for sub-28nm node semiconductor requirements , 2012, Advanced Lithography.

[15]  Yajing Shen,et al.  Specimen's plane misaligned installation solution based on charge fluctuation inside SEM , 2018 .

[16]  Toshio Fukuda,et al.  Automatic Sample Alignment Under Microscopy for 360° Imaging Based on the Nanorobotic Manipulation System , 2017, IEEE Transactions on Robotics.

[17]  Michael G. Ruppert,et al.  High-Bandwidth Demodulation in MF-AFM: A Kalman Filtering Approach , 2016, IEEE/ASME Transactions on Mechatronics.

[18]  Xiong Yang,et al.  Nanorobotic System for Precise In Situ Three-Dimensional Manufacture of Helical Microstructures , 2018, IEEE Robotics and Automation Letters.

[19]  Toshio Fukuda,et al.  Dynamic Force Characterization Microscopy Based on Integrated Nanorobotic AFM and SEM System for Detachment Process Study , 2015, IEEE/ASME Transactions on Mechatronics.

[20]  Hui Xie,et al.  Multiparametric Kelvin Probe Force Microscopy for the Simultaneous Mapping of Surface Potential and Nanomechanical Properties. , 2017, Langmuir : the ACS journal of surfaces and colloids.

[21]  Gregory A. Dahlen,et al.  Recent CD AFM probe developments for sub-45 nm technology nodes , 2008, SPIE Advanced Lithography.

[22]  B. V. Derjaguin,et al.  Effect of contact deformations on the adhesion of particles , 1975 .

[23]  Toshio Fukuda,et al.  Assembly of RGD-Modified Hydrogel Micromodules into Permeable Three-Dimensional Hollow Microtissues Mimicking in Vivo Tissue Structures. , 2017, ACS applied materials & interfaces.

[24]  Christopher G. Harris,et al.  A Combined Corner and Edge Detector , 1988, Alvey Vision Conference.

[25]  Yueming Hua,et al.  Three-dimensional imaging of undercut and sidewall structures by atomic force microscopy. , 2011, The Review of scientific instruments.

[26]  Toshio Fukuda,et al.  Nanorobotic System iTRo for Controllable 1D Micro/nano Material Twisting Test , 2017, Scientific Reports.

[27]  Li-Chen Fu,et al.  Effective Tilting Angles for a Dual Probes AFM System to Achieve High-Precision Scanning , 2016, IEEE/ASME Transactions on Mechatronics.

[28]  A. Bazaei,et al.  Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate , 2017, IEEE/ASME Transactions on Mechatronics.

[29]  Rick Kneedler,et al.  3D metrology solution for the 65-nm node , 2004, SPIE Photomask Technology.

[30]  Bharat Bhushan Biophysics of Human Hair: Structural, Nanomechanical, and Nanotribological Studies , 2010 .

[31]  Mohsen Hamedi,et al.  An investigation into resonant frequency of trapezoidal V-shaped cantilever piezoelectric energy harvester , 2016 .

[32]  Tobias Tiemerding,et al.  Automated Robotic Manipulation of Individual Colloidal Particles Using Vision-Based Control , 2015, IEEE/ASME Transactions on Mechatronics.