Quantitative measurement of displacement and strain fields from HREM micrographs

[1]  M. J. Hÿch,et al.  Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu3Au , 1997 .

[2]  V. Pontikis,et al.  Atomic structure of the ∑ = 5, (210) and (310), [001] tilt axis grain boundaries in Mo: a joint study by computer simulation and high-resolution electron microscopy , 1997 .

[3]  A. Thorel,et al.  Ferroelectric Domain Walls in BaTiO3: Fingerprints in XRPD Diagrams and Quantitative HRTEM Image Analysis , 1997 .

[4]  P. Bayle-Guillemaud,et al.  Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing , 1997 .

[5]  M. Hytch,et al.  Analysis of Variations in Structure from High Resolution Electron Microscope Images by Combining Real Space and Fourier Space Information , 1997 .

[6]  M. Takeda,et al.  Crystallographic heterodyne phase detection for highly sensitive lattice-distortion measurements , 1996 .

[7]  M. Hÿtch,et al.  Quantitative criteria for the detection and characterization of nanocrystals from high-resolution electron microscopy images , 1995 .

[8]  J. E. Currie,et al.  Determination of elastic strains in epitaxial layers by HREM , 1995 .

[9]  Susanne Stemmer,et al.  Atomistic structure of 90° domain walls in ferroelectric PbTiO3 thin films , 1995 .

[10]  K. Scheerschmidt,et al.  Retrieval of object information from electron diffraction. I. Theoretical Preliminaries , 1994 .

[11]  Thierry Deutsch,et al.  Quantitative analysis of the deformation and chemical profiles of strained multilayers , 1994 .

[12]  G. Feuillet,et al.  Strain mapping of ultrathin epitaxial ZnTe and MnTe layers embedded in CdTe , 1994 .

[13]  O. Brandt,et al.  Direct measurement of local lattice distortions in strained layer structures by HREM , 1993 .

[14]  Wolfgang Baumeister,et al.  From lattice distortion to molecular distortion : characterising and exploiting crystal deformation , 1992 .

[15]  G. Ling,et al.  Can we see living structure in a cell? , 1992, Scanning microscopy.

[16]  J. M. Gibson,et al.  The effects of elastic relaxation on transmission electron microscopy studies of thinned composition-modulated materials , 1986 .

[17]  W. Stobbs,et al.  The relative accuracy of axial and non‐axial methods for the measurement of lattice spacings , 1983 .

[18]  W. O. Saxton,et al.  The correlation averaging of a regularly arranged bacterial cell envelope protein , 1982, Journal of microscopy.

[19]  J. Nye.  Physical Properties of Crystals: Their Representation by Tensors and Matrices , 1957 .

[20]  T. R. Judge,et al.  A review of phase unwrapping techniques in fringe analysis , 1994 .

[21]  M. Takeda,et al.  Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry , 1982 .

[22]  J. M. Cowley,et al.  The effect of lens aberrations on lattice images of spinodally decomposed alloys , 1979 .

[23]  W. O. Saxton,et al.  Digital image processing: The semper system , 1979 .