Comparison of total dose effects on micropower op-amps: bipolar and CMOS
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[1] James M. Puhl,et al. ACCELERATED TESTS FOR SIMULATING LOW DOSE RATE GAIN DEGRADATION OF LATERAL AND SUBSTRATE PNP BIPOLAR JUNCTION TRANSISTORS , 1996 .
[2] R. L. Pease,et al. Hardness-assurance issues for lateral PNP bipolar junction transistors , 1995 .
[3] peixiong zhao,et al. Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates , 1994 .
[4] Allan H. Johnston,et al. Enhanced damage in linear bipolar integrated circuits at low dose rate , 1995 .
[5] Allan H. Johnston,et al. Enhanced damage in bipolar devices at low dose rates: effects at very low dose rates , 1996 .
[6] R. L. Pease,et al. Trends in the total-dose response of modern bipolar transistors , 1992 .
[7] Allan H. Johnston,et al. Hardness Assurance Techniques for New Generation COTS Devices , 1996 .
[8] R. Pease,et al. Dependence of total dose response of bipolar linear microcircuits on applied dose rate , 1994 .