Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER
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F. Wrobel | F. Saigne | J. Boch | G. Gasiot | P. Roche | K. Castellani-Coulie | J.-M. Palau | B. Sagnes | T. Carriere | J.R. Vaille | T. Merelle | H. Chabane | M.-C. Palau
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