Conduction and Low-Frequency Noise Analysis in $ \hbox{Al}/\alpha\hbox{-TiO}_{X}/\hbox{Al}$ Bipolar Switching Resistance Random Access Memory Devices
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Hyuck-In Kwon | Jong-Ho Lee | Sung-Yool Choi | In-Tak Cho | Jong-Ho Lee | H. Jeong | Sung‐Yool Choi | Jeong Yong Lee | H. Kwon | Hu Young Jeong | I. Cho | Jung-Kyu Lee | Jung-Kyu Lee | Jeong Yong Lee | Jong-Ho Lee
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