TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages

This paper presents the Thermal Resistance and Impedance Calculator (TRIC) tool devised for the automatic extraction of thermal metrics of package families of electronic components in both static and transient conditions. TRIC relies on a solution algorithm based on a novel projection-based approach, which—unlike previous techniques—allows (i) dealing with parametric detailed thermal models (pDTMs) of package families that exhibit generic non-Manhattan variations of geometries and meshes, and (ii) transforming such pDTMs into compact thermal models that can be solved in short times. Thermal models of several package families are available, and dies with multiple active areas can be handled. It is shown that transient thermal responses of chosen packages can be obtained in a CPU (central processing unit) time much shorter than that required by a widely used software relying on the finite-volume method without sacrificing accuracy.

[1]  Tom J. Smy,et al.  A 3D thermal simulation tool for integrated devices-Atar , 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  Paolo Maffezzoni,et al.  Compact modeling of electrical devices for electrothermal analysis , 2003 .

[3]  M.-N. Sabry Flexible Profile Compact Thermal Models for Practical Geometries , 2007 .

[4]  Kevin Skadron,et al.  HotSpot: a compact thermal modeling methodology for early-stage VLSI design , 2006, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[5]  Sung-Mo Kang,et al.  Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices , 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[6]  Clemens J. M. Lasance,et al.  Ten Years of Boundary-Condition- Independent Compact Thermal Modeling of Electronic Parts: A Review , 2008 .

[7]  P. Maffezzoni,et al.  Multipoint moment matching reduction from port responses of dynamic thermal networks , 2005, IEEE Transactions on Components and Packaging Technologies.

[8]  Arianna Morelli,et al.  TRAC: A Thermal Resistance Advanced Calculator for Electronic Packages , 2019, Energies.

[9]  A. Bar-Cohen,et al.  Theta /sub JC/ characterization of chip packages-justification, limitations, and future , 1989, Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium.

[10]  D. D’Amore,et al.  Modeling the thermal response of semiconductor devices through equivalent electrical networks , 2002 .

[11]  H. Vinke,et al.  Thermal characterization of electronic devices with boundary condition independent compact models , 1995 .

[12]  Andrea Irace,et al.  Circuit-Based Electrothermal Simulation of Power Devices by an Ultrafast Nonlinear MOR Approach , 2016, IEEE Transactions on Power Electronics.

[13]  D. Schweitzer,et al.  Thermal transient modeling and experimental validation in the European project PROFIT , 2004 .