Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode
暂无分享,去创建一个
Satoshi Kawata | Norihiko Hayazawa | Yuika Saito | Masato Iyoki | S. Kawata | Y. Saito | N. Hayazawa | Masashi Motohashi | M. Motohashi | M. Iyoki
[1] F. H. Dacol,et al. Measurements of alloy composition and strain in thin GexSi1−x layers , 1994 .
[2] S. Kawata,et al. Metallized tip amplification of near-field Raman scattering , 2000 .
[3] J. Maguire,et al. Nano-Raman spectroscopy with side-illumination optics , 2005 .
[4] D. Bulgarevich,et al. Apertureless Tip-Enhanced Raman Microscopy with Confocal Epi-Illumination/Collection Optics , 2004, Applied spectroscopy.
[5] M. Anderson,et al. A Raman-atomic force microscope for apertureless-near-field spectroscopy and optical trapping , 2002 .
[6] David N. Batchelder,et al. Submicron resolution measurement of stress in silicon by near-field Raman spectroscopy , 1998 .
[7] R. Zenobi,et al. Nanoscale chemical analysis by tip-enhanced Raman spectroscopy , 2000 .
[8] F. Keilmann,et al. Near-field probing of vibrational absorption for chemical microscopy , 1999, Nature.
[9] Donald J. Siegel,et al. Understanding the magnetocatalytic effect: magnetism as a driving force for surface segregation. , 2004, Physical review letters.
[10] Fischer Uc,et al. Observation of single-particle plasmons by near-field optical microscopy. , 1989 .
[11] Gary G. Goodman,et al. Characterization of strained Si structures using SIMS and visible Raman , 2005 .
[12] Lukas Novotny,et al. High-resolution near-field Raman microscopy of single-walled carbon nanotubes. , 2003, Physical review letters.
[13] S. Kawata,et al. Tip-enhanced coherent anti-stokes Raman scattering for vibrational nanoimaging. , 2004, Physical review letters.
[14] S. Zollner,et al. Visible and ultraviolet Raman scattering studies of Si1−xGex alloys , 2000 .
[15] Thomas E. Furtak,et al. Surface-Enhanced Raman Scattering , 1982 .
[16] S. Kawata,et al. Near-field scanning optical microscope with a metallic probe tip. , 1994, Optics letters.
[17] T. Perova,et al. Composition and stress analysis in Si structures using micro-raman spectroscopy. , 2006, Scanning.
[18] Satoshi Kawata,et al. Near-field Raman scattering enhanced by a metallized tip , 2001 .
[19] Suresh S. Jain,et al. Spatially resolved stress analysis using Raman spectroscopy , 1999 .
[20] Shui-Tong Lee,et al. Effects of in situ vacuum annealing on the surface and luminescent properties of ZnS nanowires , 2005 .
[21] A. Boccara,et al. Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip. , 1997, Applied optics.