Damages induced by synchrotron radiation-based X-ray microanalysis in chrome yellow paints and related Cr-compounds: assessment, quantification and mitigation strategies.
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M. Cotte | J. Garrevoet | G. Falkenberg | P. Glatzel | A. Romani | C. Miliani | K. Janssens | F. Vanmeert | Gert Nuyts | L. Monico | L. Amidani