Quantifying parameter uncertainties in optical scatterometry using Bayesian inversion
暂无分享,去创建一个
Bernd Bodermann | Sven Burger | Lin Zschiedrich | Martin Hammerschmidt | Martin Weiser | Xavier Garcia Santiago | L. Zschiedrich | S. Burger | M. Weiser | M. Hammerschmidt | B. Bodermann | Xavier Garcia Santiago
[1] S. Burger,et al. Fast simulation method for parameter reconstruction in optical metrology , 2013, Advanced Lithography.
[2] Jan Richter,et al. Deep ultraviolet scatterometer for dimensional characterization of nanostructures: system improvements and test measurements , 2011 .
[3] Faming Liang,et al. Statistical and Computational Inverse Problems , 2006, Technometrics.
[4] Frank Schmidt,et al. Adaptive finite element method for simulation of optical nano structures , 2007, 0711.2149.
[5] Frank Schmidt,et al. The influence of line edge roughness and CD uniformity on EUV scatterometry for CD characterization of EUV masks , 2007, SPIE Optical Metrology.
[6] W. Häßler-Grohne,et al. International photomask linewidth comparison by NIST and PTB , 2008, Photomask Technology.
[7] Peter Deuflhard,et al. Newton Methods for Nonlinear Problems , 2004 .
[8] Clemens Elster,et al. A tutorial on Bayesian Normal linear regression , 2015 .
[9] Bernd Bodermann,et al. Metrology of nanoscale grating structures by UV scatterometry. , 2017, Optics express.
[10] Ying Li,et al. Computational metrology and inspection (CMI) in mask inspection, metrology, review, and repair , 2012 .
[11] A. Rathsfeld,et al. Profile reconstruction in extreme ultraviolet (EUV) scatterometry: modeling and uncertainty estimates , 2009 .
[12] Frank Scholze,et al. Correlated Diffuse X-ray Scattering from Periodically Nano-Structured Surfaces , 2016 .
[13] Andreas Griewank,et al. Evaluating derivatives - principles and techniques of algorithmic differentiation, Second Edition , 2000, Frontiers in applied mathematics.
[14] T. Sullivan. Introduction to Uncertainty Quantification , 2015 .
[15] Clemens Elster,et al. A maximum likelihood approach to the inverse problem of scatterometry. , 2012, Optics express.