Research on VLSI test compression

This paper explores the recent classic VLSI test compression methods, analyses the characteristics of each methods, make compression among them, the advantages and disadvantages of each proposed approaches are expounded. The main purpose for test compression is to reduce test application time, hardware overhead and test cost. The test compression solutions are mainly based on scan chain, and the X-filling methods are adopted for test compression. Finally this paper outlooks the prospective of VLSI test compression.

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