A Power Measuring Technique for Built-in Test Purposes

A built-in configuration for monitoring the good operating condition of an instrumentation system (with analog and digital circuits) in real-time, is presented in this work. The approach is based on a current monitoring circuit which records the changes in the power supply current of the system without practically interfering the operation of the system and sums it within a specific time period. The comparison of the resulting power consumption measurement for hardware modules while executing certain tasks (defined in time by the software) with already known values may indicate the good operating condition of the system. This methodology may also provide information useful to power optimization techniques

[1]  Th. Laopoulos,et al.  Measurements analysis of the software-related power consumption in microprocessors , 2003, IMTC 2003.

[2]  D. M. H. Walker,et al.  A practical built-in current sensor for I/sub DDQ/ testing , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[3]  Th. Laopoulos,et al.  An intelligent microcontroller-based configuration for sensor validation and error compensation , 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

[4]  Carlo Dallavalle Adaptive IDDQ: how to set an IDDQ limit for any device under test , 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

[5]  Rodrigo Picos,et al.  A configurable built in current sensor for mixed signal circuit testing , 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..

[6]  Bruce Jacob,et al.  Instruction-level power dissipation in the Intel XScale embedded microprocessor , 2005, IS&T/SPIE Electronic Imaging.

[7]  V. Konstantakos,et al.  In-Chip Configuration for Monitoring Power Consumption in Micro-processing Systems , 2005, 2005 IEEE Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications.

[8]  Kozo Kinoshita,et al.  I/sub DDQ/ sensing technique for high speed IDDQ testing , 2001, Proceedings 10th Asian Test Symposium.

[9]  Sharad Malik,et al.  Instruction level power analysis and optimization of software , 1996, J. VLSI Signal Process..

[10]  Alkis A. Hatzopoulos,et al.  A simple built-in current sensor for current monitoring in mixed-signal circuits , 1997 .

[11]  Chun-Lung Hsu,et al.  Current-mode BIST structure for mixed-signal circuits , 2002, Proceedings of the 4th International Symposium on Electronic Materials and Packaging, 2002..

[12]  Naehyuck Chang,et al.  Cycle-accurate energy measurement and characterization with a case study of the ARM7TDMI [microprocessors] , 2002, IEEE Trans. Very Large Scale Integr. Syst..

[13]  Jeong Beom Kim,et al.  Design of a CMOS built-in current sensor for on-line current testing , 2003, ASICON 2003.