A Power Measuring Technique for Built-in Test Purposes
暂无分享,去创建一个
[1] Th. Laopoulos,et al. Measurements analysis of the software-related power consumption in microprocessors , 2003, IMTC 2003.
[2] D. M. H. Walker,et al. A practical built-in current sensor for I/sub DDQ/ testing , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).
[3] Th. Laopoulos,et al. An intelligent microcontroller-based configuration for sensor validation and error compensation , 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).
[4] Carlo Dallavalle. Adaptive IDDQ: how to set an IDDQ limit for any device under test , 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
[5] Rodrigo Picos,et al. A configurable built in current sensor for mixed signal circuit testing , 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..
[6] Bruce Jacob,et al. Instruction-level power dissipation in the Intel XScale embedded microprocessor , 2005, IS&T/SPIE Electronic Imaging.
[7] V. Konstantakos,et al. In-Chip Configuration for Monitoring Power Consumption in Micro-processing Systems , 2005, 2005 IEEE Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications.
[8] Kozo Kinoshita,et al. I/sub DDQ/ sensing technique for high speed IDDQ testing , 2001, Proceedings 10th Asian Test Symposium.
[9] Sharad Malik,et al. Instruction level power analysis and optimization of software , 1996, J. VLSI Signal Process..
[10] Alkis A. Hatzopoulos,et al. A simple built-in current sensor for current monitoring in mixed-signal circuits , 1997 .
[11] Chun-Lung Hsu,et al. Current-mode BIST structure for mixed-signal circuits , 2002, Proceedings of the 4th International Symposium on Electronic Materials and Packaging, 2002..
[12] Naehyuck Chang,et al. Cycle-accurate energy measurement and characterization with a case study of the ARM7TDMI [microprocessors] , 2002, IEEE Trans. Very Large Scale Integr. Syst..
[13] Jeong Beom Kim,et al. Design of a CMOS built-in current sensor for on-line current testing , 2003, ASICON 2003.