论文信息 - MEASUREMENTS OF X-RAY SPECTRA ON ECR-II*

MEASUREMENTS OF X-RAY SPECTRA ON ECR-II*

FAR-TECH, Inc. has been developing an inexpensive and robust X-ray spectral diagnostic for monitoring electron cyclotron resonance ion sources (ECRIS). To this end, FAR-TECH, Inc. has recently performed extensive measurements of X-ray emission from the ECR-II device in the ATLAS facility at Argonne National Laboratory. We find that both the intensity and the shape of the observed spectra are highly correlated with the charge state distribution (CSD) of ions extracted from the ECR-II plasma as measured by a Faraday cup (FC).

J. Kim | I. Bogatu | R. Pardo | R. Vondrasek | L. Zhao

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