Liquid crystal imaging for temperature measurement of electronic devices

The liquid crystal imaging (LCI) technique has been shown to be a viable method for part level temperature measurement. The steps necessary to develop this capability and its sensitivity to various parameters are discussed and highlighted. Comparison of LCI and point measurement showed that high accuracy can be achieved with this method. The spatial resolution which plays a critical role in this measurement was shown to be attainable for part level measurements. Even higher spatial resolution can be attained with modifications to the optics and image processing software. Calibration procedures are also described.<<ETX>>