Dielectric characterization of low-loss materials a comparison of techniques
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Jerzy Krupka | Chriss A. Jones | Richard G. Geyer | James R. Baker-Jarvis | Claude Weil | Billy F. Riddle | Michael D. Janezic | J. H. Grosvenor | John H. Grosvenor | C. Weil | J. Krupka | R. Geyer | M. Janezic | J. Baker-Jarvis | B. Riddle | C. Jones
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