论文信息 - Statistical pin pair combinations — a new proposal for device level HBM tests

Statistical pin pair combinations — a new proposal for device level HBM tests

This paper proposes an alternate HBM test strategy to reflect today¿s IC designs and package. The detailed proposal outlines a new procedure where all IC pins are treated equally, and the pin pair combinations are selected statistically. Some initial experimental data is presented to illustrate the validity and advantages of this procedure.

C. Duvvury | R. Gaertner | T. Brodbeck | W. Stadler

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