Evaluation of fabrication process and barrier structure for interface-modified ramp-edge junctions
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K. Tanabe | Y. Tarutani | M. Horibe | S. Adachi | Y. Oshikubo | Y. Ishimaru | H. Wakana | Toshiaki Suzuki | M. Iiyama | H. Sugiyama | O. Horibe | Y. Wu | Hiroyoshi Tano | Y. Takahashi | Y. Yoshida
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