A test point selection method for data converters using Rademacher functions and wavelet transforms
暂无分享,去创建一个
A new test method of linearity errors for data converters is presented. Based in principle of the test point selection (NIST) method, this test method combines Rademacher functions and wavelet transforms to create a linearity error model for the data converter. Test results from an analog-to-digital converter and a digital-to-analog converter are presented and compared to other reported methods
[1] G. Stenbakken,et al. Developing linear error models for analog devices , 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.
[2] Gerard N. Stenbakken,et al. A comprehensive approach for modeling and testing analog and mixed-signal devices , 1990, Proceedings. International Test Conference 1990.