Efficient UBIST implementation for microprocessor sequencing parts

An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results.<<ETX>>

[1]  William C. Carter,et al.  Design of dynamically checked computers , 1968, IFIP Congress.

[2]  Bernard Courtois,et al.  Microarchitecture of the MC 68000 and Evaluation of a Self Checking Version , 1985 .

[3]  Takashi Nanya,et al.  Multiple stuck-at fault testability of self-testing checkers , 1988, [1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.

[4]  Michael Nicolaidis.  Evaluation of a self-checking version of the mc 68000 microprocessor , 1987 .

[5]  Michael Nicolaidis.  Shorts in self-checking circuits , 1991, J. Electron. Test..

[6]  James E. Smith,et al.  Strongly Fault Secure Logic Networks , 1978, IEEE Transactions on Computers.

[7]  Jacob A. Abraham,et al.  Concurrent error detection in highly structured logic arrays , 1984 .

[8]  Michael Nicolaidis.  A unified built-in-test scheme: UBIST , 1988, [1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.

[9]  Wilfried Daehn,et al.  A Hardware Approach to Self-Testing of Large Programmable Logic Arrays , 1981, IEEE Transactions on Computers.

[10]  Michael Nicolaidis,et al.  New implementations, tools, and experiments for decreasing self-checking PLAs area overhead , 1991, [1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors.

[11]  D. A. Anderson,et al.  Design of self-checking digital networks using coding techniques , 1971 .

[12]  Michael Nicolaidis,et al.  Self-exercising checkers for unified built-in self-test (UBIST) , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[13]  M. M. Yen,et al.  Designing for concurrent error detection in VLSI: application to a microprogram control unit , 1987 .

[14]  Ahmed Amine Jerraya,et al.  Principles of the SYCO Compiler , 1986, DAC 1986.

[15]  M. Nicolaidis.  An Unified Built in Self-Test Scheme : UBIST , 1986, ESSCIRC '86: Twelfth European Solid-State Circuits Conference.

[16]  Imag Tim,et al.  UBIST VERSION OF THE SYCO's CONTROL SECTION COMPILER' , 1988 .

[17]  Michael Nicolaidis,et al.  Design of Self-Checking Integrated Circuits and Boards , 1991 .

[18]  Michael Nicolaidis,et al.  A self-checking PLA automatic generator tool based on unordered codes encoding , 1991, Proceedings of the European Conference on Design Automation..

[19]  Bernard Courtois,et al.  Strongly Code Disjoint Checkers , 1988, IEEE Trans. Computers.