论文信息 - Reliability analysis of gamma- and X-ray TID effects, on a commercial AlGaN/GaN based FET - 字舞流文

Reliability analysis of gamma- and X-ray TID effects, on a commercial AlGaN/GaN based FET

Nilberto H. Medina | S. Finco | R. Giacomini | L. Seixas | M. Guazzelli | A. C. Vilas Bôas | T. Cavalcante | Saulo Gabriel Alberton | Vitor Ângelo Paulino | Marco Antonio Assis Melo | Roberto Baginski Santos | Rafael Galhardo Vaz | E. Junior